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Electromigration is an ever-increasing problem as integrated circuits are pushed towards further miniaturization. The theory of the phenomenon is explained, including electromigration-induced failure and how it has been and can be minimized.

	Aims Before you start Introduction The theory of electromigration Electromigration damage Flux divergence (I) Flux divergence (II) Avoiding electromigration problems Alternatives to aluminium metallization Summary Questions Going further
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First created: June 2006.